NORTH READING & WALTHAM, USA: Teradyne Inc. and Galaxy Semiconductor Solutions have entered into a strategic alliance to jointly offer customers solutions for optimizing device quality and reliability by utilizing Parts Average Testing and other Defects Per Million (DPM) reduction techniques.
Under the terms of the agreement, Teradynes Test Assistance Groups (TAG) network of more than 500 applications engineers will offer applications engineering and integration services to customers who wish to deploy Galaxys PAT-MAN software in a production environment. Teradyne and Galaxy will jointly market and deliver the solution.
Galaxys PAT-MAN is a comprehensive software solution for PAT and related DPM reduction techniques, which manages the entire PAT process from initial wafer lot characterization to final-test yield monitoring. PAT-MAN employs a closed-loop approach to PAT, which helps improve device quality while minimizing unnecessary yield loss.
PAT-MAN also offers a unique, easy-to-use environment for fast setup and simulation of outlier rules, and an automated monitoring system for managing PAT-related yield in production.
“We are pleased to include Galaxy in our Third Party Solution Provider Program,” said Roy Chorev, Teradynes Semiconductor Test software product manager. “Galaxys PAT-MAN software clearly enhances the value of our test systems for customers in the automotive electronics market and other high reliability sectors. With our Galaxy partnership, we can now help customers rapidly deploy PAT while optimizing their overall test process.”
“A number of Teradynes major customers have successfully deployed Part Average Testing using Galaxy PAT-MAN in conjunction with Teradyne FLEX and J750 test systems,” said Bertrand Renaud, COO at Galaxy. “By partnering with Teradyne, we can now offer other customers a complete solution for PAT and other DPM reduction techniques leveraging the production-proven PAT-MAN software and the expertise of Teradynes global services organization.”