HOPKINTON, USA: Test Evolution, the leading supplier of OEM test products based on the AXIe 3.1 open standard, has announced its first instrument modules as part of the Evolution© series of test systems focused on the semiconductor test market.
Test Evolution’s new 48-Channel DD48 Digital Pin Module and the 12-channel DPS12 Digital Power Source module bring test capability in an open hardware and software platform for both device characterization and production test. Using common instruments and test programs lowers the cost of test and speeds up time to volume production.
"The AXIe standard enables high performance instrumentation in an open standard modular solution. This will enable a renaissance in low-cost, focused test solutions in semiconductor test applications," said Lev Alperovich, president, Test Evolution.
"The DD48 and DPS12 will give customers the performance necessary to test today’s digital and mixed-signal devices in an open platform, in both characterization and production environments, improving productivity, time to market, and ultimately profitability."